Characterization of Imaging of Localized Surface Reactions with Probe Microscopy. Scanning Probe Microscopy in Controlled Environment.
نویسندگان
چکیده
منابع مشابه
Scanning hall probe microscopy technique for investigation of magnetic properties
Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor. SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...
متن کاملScanning hall probe microscopy technique for investigation of magnetic properties
Scanning Hall Probe Microscopy (SHPM) is a scanning probe microscopy technique developed to observe and image magnetic fields locally. This method is based on application of the Hall Effect, supplied by a micro hall probe attached to the end of cantilever as a sensor. SHPM provides direct quantitative information on the magnetic state of a material and can also image magnetic induction under a...
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M ore and more nanoparticles are used in advanced materials, medical imaging and drug delivery, and their industrial scale production is just around the corner. The flip side of this is the risk associated with human exposure to nanoparticles, whether through unintentional inhalation or deliberate injection and ingestion. Detailed toxicity studies are needed to ensure the safe and successful us...
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This paper presents an al~or i f l i rn for recovering, in st lu, thc shapc of zhc probp used in FL Rcnnnlng prohe microscope. Thp inputs to the d g o r ~ l ~ l ~ n i are the imREP of A reference si~rlarc and the known shapc of 1 he rrCerence surIacr Thr o11tpi11 in n drpth map rrprewriting the lhrw ~ l i r n ~ n ~ i o n a l sh pr of ~11c prnhr 'I'his recovered pmbc shapc can ho uscd to rPstorP...
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ژورنال
عنوان ژورنال: Journal of the Surface Finishing Society of Japan
سال: 2000
ISSN: 0915-1869,1884-3409
DOI: 10.4139/sfj.51.42